Pooja, Hattarki, VTU, Belagavi, India

• Vol 13, No 4: December 2024 - Deep Learning
  Anchor selection based deep learning two stage fabric defect localization
  Abstract  PDF

This work is licensed under a Creative Commons Attribution-ShareAlike 4.0 International License.

IAES International Journal of Artificial Intelligence (IJ-AI)
ISSN/e-ISSN 2089-4872/2252-8938 
This journal is published by the Institute of Advanced Engineering and Science (IAES).

View IJAI Stats