C. R., Vishwanatha, Visvesvaraya Technological University, India

• Vol 14, No 5: October 2025 - Others
  Automated vial defect inspection using Gabor wavelets and k-means clustering
  Abstract  PDF

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IAES International Journal of Artificial Intelligence (IJ-AI)
ISSN/e-ISSN 2089-4872/2252-8938 
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