DualFaceNet: augmentation consistency for optimal facial landmark detection and face mask classification
Abstract
In an era where face masks are commonplace, facial recognition faces new challenges and opportunities. This study introduces DualFaceNet (DFN), a cutting-edge neural network that efficiently combines facial landmark detection with mask classification. Benefiting from multi-task learning (MTL) and enhanced with a unique consistency loss, DFN outperforms traditional single-task models. Tests using the reputable 300W dataset and a face mask dataset showcase DFN’s strengths: a significant reduction in landmark error to 5.42 and an increase in mask classification accuracy to 92.59%. These results highlight the potential of integrating MTL and custom loss functions in facial recognition. As face masks continue to be globally essential, DFN’s integrated approach offers a fresh perspective in facial recognition studies. Furthermore, DFN paves the way for adaptive facial recognition systems, emphasizing the adaptability needed in our current era.
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PDFDOI: http://doi.org/10.11591/ijai.v13.i3.pp3228-3239
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IAES International Journal of Artificial Intelligence (IJ-AI)
ISSN/e-ISSN 2089-4872/2252-8938
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).