Chater, Ahmed, University Mohammed V, Morocco

• Vol 12, No 4: December 2023 - Machine Learning
  New approach to similarity detection by combining technique three-patch local binary patterns (TP-LBP) with support vector machine
  Abstract  PDF

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IAES International Journal of Artificial Intelligence (IJ-AI)
ISSN/e-ISSN 2089-4872/2252-8938 
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).

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