V, Sangeetha, Periyar University College, India

• Vol 9, No 3: September 2020 - Machine Learning
  Fault-type coverage based ant colony optimization algorithm for attaining smaller test suite
  Abstract  PDF

This work is licensed under a Creative Commons Attribution-ShareAlike 4.0 International License.

IAES International Journal of Artificial Intelligence (IJ-AI)
ISSN/e-ISSN 2089-4872/2252-8938 
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).

View IJAI Stats