Selvan, Sethu Selvi, M.S. Ramaiah Institute of Technology, India

• Vol 11, No 3: September 2022 - Neural_Network
  A deep learning approach based defect visualization in pulsed thermography
  Abstract  PDF

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IAES International Journal of Artificial Intelligence (IJ-AI)
ISSN/e-ISSN 2089-4872/2252-8938 
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).

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