An artificial intelligence technology for promoting hom-thong banana agriculture system

Ratsames Tanveenukool, Suwit Somsuphaprungyos, Boonyarit Nokkurth, Likit Chamuthai, Patumwadee Bonguleaum, Parinya Natho

Abstract


The hom-thong banana, being a high-value Thai export variety, is facing significant risk from disease outbreaks affecting crop yield and quality. Traditional visual inspection methods in detection of diseases are labor consuming, error-prone. This research addresses these limitations by developing a new artificial intelligence (AI)-based automatic disease detection system for the hom-thong banana industry on top of cutting-edge computer vision technology. The study employed deep learning object detection models, contrasting Roboflow, you only look once (YOLO)v11, and YOLOv12 architectures, which were trained on a large dataset of 2,576 images of Thai banana plantations. With systematic data augmentation techniques, the dataset was augmented to 6,184 images of seven types of disease under varied environmental conditions. The method entailed extensive preprocessing and evaluation of performance through precision, recall, and mean average precision (mAP) metrics. Outcomes indicated that YOLOv12 outperformed with 93.3% accuracy, 83.3% sensitivity, and 86.3% mAP@50 compared to standard inspection schemes. This research is applicable to Thailand's smart agriculture initiative by providing farmers with low-cost, accurate, and effective disease monitoring equipment. The application of this AI system has the ability to enhance the yield of crops, reduce losses, and enhance the competitiveness of Thai banana exports in the global market, in support of sustainable agricultural development.

Keywords


Agriculture system; Artificial intelligence; Hom-thong banana diseases; Promoting hom-thong; YOLO model

Full Text:

PDF


DOI: http://doi.org/10.11591/ijai.v15.i1.pp568-579

Refbacks

  • There are currently no refbacks.


Copyright (c) 2026 Ratsames Tanveenukool, Suwit Somsuphaprungyos, Boonyarit Nokkurth, Likit Chamuthai, Patumwadee Bonguleaum, Parinya Natho

Creative Commons License
This work is licensed under a Creative Commons Attribution-ShareAlike 4.0 International License.

IAES International Journal of Artificial Intelligence (IJ-AI)
ISSN/e-ISSN 2089-4872/2252-8938 
This journal is published by the Institute of Advanced Engineering and Science (IAES).

View IJAI Stats