Son, Nguyen Van, MIST, Viet Nam

• Vol 10, No 3: September 2021 - Machine Learning
  A two-phase plagiarism detection system based on multi-layer long short-term memory networks
  Abstract  PDF

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IAES International Journal of Artificial Intelligence (IJ-AI)
ISSN/e-ISSN 2089-4872/2252-8938 
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).

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